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EM-ISight has evolved into an automated solution for many technologies as it supports design, development and certification of electronics. By evaluating the near-field of a given device, EM-ISight can help to identify the source of problems and our far-field approximation software feature compliments existing test methods.
(9 KHz - 40 GHz)
Analyze electromagnetic signals from low to high frequencies with one system, suitable for a wide array of applications using E or M field vector probes.
(0.01 mm)
Map even the finest electromagnetic fields with unparalleled precision, perfect for high-density PCBs and intricate circuits.
(>10 mm)
Quickly survey larger areas to locate hotspots or regions requiring further detailed analysis.
Real-time feedback ensures accurate and efficient measurements, adapting seamlessly to user adjustments down to 0.05 mm.
(X, Y, Z, PHI)
Combine spatial and angular measurements for a complete understanding of field distributions and their interactions.
Visualize field distributions intuitively in 3D or 4D, identifying interference sources, hotspots, and emission zones.
Determine the exact direction of electromagnetic energy sources for quick and effective diagnostics.
Generate detailed, professional reports automatically, tailored to meet your testing and compliance needs.
Experience unmatched flexibility and precision with advanced robotic arms that automate complex or hard-to-reach scanning tasks.
From high-resolution scans to 4D measurements, the system ensures every detail is captured accurately.
A wide frequency range, coarse and fine scanning options, and articulated robotic systems make it adaptable to diverse testing needs.
Intuitive 3D and 4D plotting along with source direction vectors simplify complex data into actionable insights.
User-friendly software and automated reporting streamline your workflow, saving valuable time and effort.
The articulated robotic arm options enable automated, repeatable measurements, reducing manual intervention and ensuring consistent results utilizing vector probes.
Whether you're analyzing small circuits or large systems, the EM-ISight System is built to tackle today's challenges and tomorrow's innovations.
The EM-ISight-ESD is an advanced system for real-time ESD measurement and analysis, utilizing robotics and precise magnetic H-field probes with 20 µm spatial accuracy. This enables detailed visualization of ESD events across frequency, time, and space, helping diagnose disruptions and enhance circuit designs.
(9 KHz TO 6 GHz)
A single E or M field vector probe covers a broad frequency range, making it efficient for analyzing electromagnetic fields and ESD events without the need for multiple probes.
Accurately captures and analyzes electromagnetic coupling caused by ESD (Electrostatic Discharge) events, ensuring precise diagnostics.
Visualize field distributions intuitively in 3D or 4D, identifying interference sources, hotspots, and emission zones.
Frequency and time-domain data can be converted into real-time video for advanced analysis and presentations, improving clarity and communication of results.
A versatile positioner supports multiple circuit discharge options, ensuring compatibility with different ESD test setups.
A built-in validation target normalizes ESD events, ensuring consistent and accurate measurements across different scenarios.
Includes a complete suite of tools to simplify near-field measurement, analysis, and reporting.
(600MM, CARTESIAN)
Supports scanning large areas for comprehensive testing, ideal for bigger DUTs (Devices Under Test)
(>0.02 mm)
Enables precise detection of electromagnetic and ESD effects, essential for detailed analyses
Quickly identifies peaks during coarse scans, saving time and ensuring that critical areas are detected for further analysis
Dynamically analyzes topological data in Cartesian or Horizontal mode, providing actionable insights during testing
(0.05mm TO 600mm)
Flexible vertical scanning range ensures compatibility with DUTs of varying shapes and sizes.
Combines spatial and angular measurements to deliver comprehensive field analysis.
Visualize field distributions with quick image processing at an impressive resolution of 2.2µm.
Vector probes pinpoint the direction of field sources, enabling users to locate and address potential interference or emissions.
Automatically generate detailed and customizable test reports, reducing post-analysis effort.
Compare before-and-after measurements to observe changes in field distribution or device behavior.
Analyze frequency spans and traces with configurable limit lines for compliance testing.
Generate videos showcasing field and frequency distributions in real time, ideal for reporting or presentations.
Includes single point analysis, quick checks, free movement, and point delta functions for versatile testing options.
Achieve unrivaled accuracy with its high-resolution capabilities and advanced scanning features.
Simplify complex analyses with user-friendly software, real-time topology insights, and customizable reports.
From 2D and 3D visualizations to 4D measurements, the EM-ISight-ESD delivers a complete picture.
Be prepared for any ESD or electromagnetic challenge with its robust and versatile design.
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